![](/img/cover-not-exists.png)
[IEEE 2015 IEEE 22nd International Conference on Software Analysis, Evolution and Reengineering (SANER) - Montreal, QC, Canada (2015.3.2-2015.3.6)] 2015 IEEE 22nd International Conference on Software Analysis, Evolution, and Reengineering (SANER) - Measuring the quality of design pattern detection results
Yang, Shouzheng, Manzer, Ayesha, Tzerpos, VassiliosYear:
2015
Language:
english
DOI:
10.1109/saner.2015.7081815
File:
PDF, 219 KB
english, 2015