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A Distributed, Reconfigurable, and Reusable BIST Infrastructure for Test and Diagnosis of 3D-Stacked ICs
Agrawal, Mukesh, Chakrabarty, Krishnendu, Eklow, BillYear:
2015
Language:
english
Journal:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
DOI:
10.1109/tcad.2015.2459044
File:
PDF, 2.36 MB
english, 2015