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[IEEE 2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2015.4.27-2015.4.29)] VLSI Design, Automation and Test(VLSI-DAT) - ROBDD-based area minimization synthesis for reconfigurable single-electron transistor arrays
Chen, Yi-Hang, Chen, Yang, Huang, Juinn-DarYear:
2015
Language:
english
DOI:
10.1109/vlsi-dat.2015.7114494
File:
PDF, 617 KB
english, 2015