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Ion-bombardment effects on PtSi/n-Si Schottky contacts studied by ballistic electron emission microscopy
G. Ru, X. Qu, S. Zhu, B. Li, C. Detavernier, R. L. Van Meirhaeghe, F. Cardon, R. A. Donaton, K. MaexYear:
2000
Language:
english
DOI:
10.1116/1.1305269
File:
PDF, 505 KB
english, 2000