Use of transmission electron microscopy in the...

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Use of transmission electron microscopy in the characterization of GaInNAs(Sb) quantum well structures grown by molecular beam epitaxy

T. Gugov, V. Gambin, M. Wistey, H. Yuen, S. Bank, J. S. Harris
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Year:
2004
Language:
english
DOI:
10.1116/1.1650853
File:
PDF, 1.01 MB
english, 2004
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