Scanning capacitance microscopy: Quantitative carrier...

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Scanning capacitance microscopy: Quantitative carrier profiling down to nanostructures

F. Giannazzo, V. Raineri, S. Mirabella, G. Impellizzeri, F. Priolo, M. Fedele, R. Mucciato
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Year:
2006
Language:
english
DOI:
10.1116/1.2151907
File:
PDF, 613 KB
english, 2006
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