Characterization of crystalline rare-earth oxide high-K...

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Characterization of crystalline rare-earth oxide high-K dielectrics grown by molecular beam epitaxy on silicon carbide

A. Fissel, M. Czernohorsky, H. J. Osten
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Year:
2006
Language:
english
DOI:
10.1116/1.2214702
File:
PDF, 506 KB
english, 2006
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