Using electron spectroscopy to verify the model of Ga...

Using electron spectroscopy to verify the model of Ga implanted during focused ion beam circuit editing

Niles, David W., Spicer, Teresa, Kee, Ronald W.
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Volume:
30
Year:
2012
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.4759249
File:
PDF, 1.73 MB
english, 2012
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