Characteristics of metal–oxide–semiconductor field-effect...

Characteristics of metal–oxide–semiconductor field-effect transistors with a functional gate using trap charging for ultralow power operation

Kudo, Takashi, Ito, Takashi, Nakajima, Anri
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Volume:
31
Year:
2013
Language:
english
Journal:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures
DOI:
10.1116/1.4773576
File:
PDF, 994 KB
english, 2013
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