Nondestructive technique for the characterization of deep traps at interlayer interfaces in thin-film multilayer semiconductor structures
J. González-hernández, E. Prokhorov, N. B. Gorev, I. F. Kodzhespirova, Y. A. KovalenkoYear:
1999
Language:
english
DOI:
10.1116/1.590918
File:
PDF, 417 KB
english, 1999