Direct measurement of x-ray mask sidewall roughness and its...

  • Main
  • Direct measurement of x-ray mask...

Direct measurement of x-ray mask sidewall roughness and its contribution to the overall sidewall roughness of chemically amplified resist features

G. W. Reynolds, J. W. Taylor, C. J. Brooks
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
1999
Language:
english
DOI:
10.1116/1.591023
File:
PDF, 709 KB
english, 1999
Conversion to is in progress
Conversion to is failed