Comparison of metrology methods for quantifying the line...

  • Main
  • Comparison of metrology methods for...

Comparison of metrology methods for quantifying the line edge roughness of patterned features

C. Nelson, S. C. Palmateer, A. R. Forte, T. M. Lyszczarz
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Year:
1999
Language:
english
DOI:
10.1116/1.591117
File:
PDF, 1.51 MB
english, 1999
Conversion to is in progress
Conversion to is failed