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SPIE Proceedings [SPIE International Conference on Interferometry '94 - Warsaw, Poland (Monday 16 May 1994)] Interferometry '94: New Techniques and Analysis in Optical Measurements - Simple CCD-based wavemeter
Skrzeczanowski, Wojciech, Sarzynski, Antoni, Wawer, Janusz, Kujawinska, Malgorzata, Patorski, KrzysztofVolume:
2340
Year:
1994
Language:
english
DOI:
10.1117/12.195942
File:
PDF, 310 KB
english, 1994