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SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology - Real-time implementation of SIFT feature extraction algorithms in FPGA
Shi, Guangming, Li, Xuelong, Huang, Bormin, Shao, A-jun, Qian, Wei-xian, Gu, Guo-hua, Lu, Kai-liVolume:
9622
Year:
2015
Language:
english
DOI:
10.1117/12.2190330
File:
PDF, 1.20 MB
english, 2015