SPIE Proceedings [SPIE International Conference on Optical Instruments and Technology 2015 - Beijing, China (Sunday 17 May 2015)] 2015 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Optical Signal Processing - Decrease scattering loss induced by surface roughness through waveguide structure optimization
Dong, Yi, Lu, Chao, Wu, Jian, Li, Zhaohui, Deng, Chuanlu, Zhu, Tao, Guo, Lili, Wang, Jianhui, Song, Zhiqiang, Shang, Yana, Pang, Fufei, Wang, TingyunVolume:
9619
Year:
2015
Language:
english
DOI:
10.1117/12.2193272
File:
PDF, 422 KB
english, 2015