AIP Conference Proceedings [AIP APPLICATION OF ACCELERATORS IN RESEARCH AND INDUSTRY: Twenty-First International Conference - Fort Worth, Texas, (USA) (8–13 August 2010)] - The Scanning Electron Microscope As An Accelerator For The Undergraduate Advanced Physics Laboratory
Peterson, Randolph S., Berggren, Karl K., Mondol, Mark, McDaniel, Floyd D., Doyle, Barney L.Year:
2011
Language:
english
DOI:
10.1063/1.3586204
File:
PDF, 1.35 MB
english, 2011