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Growth, strain relaxation properties and high-κ dielectric integration of mixed-anion GaAs1-ySby metamorphic materials
Zhu, Y., Clavel, M., Goley, P., Hudait, M. K.Volume:
116
Language:
english
Journal:
Journal of Applied Physics
DOI:
10.1063/1.4896880
Date:
October, 2014
File:
PDF, 2.38 MB
english, 2014