Evaluation of Electrophoretic Migration of Submicron...

Japanese Journal of Applied Physics 2010 / 12 Vol. 49; Iss. 12

Evaluation of Electrophoretic Migration of Submicron Particles in a Microgap by Optical and Current Responses

Sugita, Tatsuya, Ohshima, Tetsuya
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Volume:
49
Language:
english
Journal:
Japanese Journal of Applied Physics
DOI:
10.1143/JJAP.49.126602
Date:
December, 2010
File:
PDF, 553 KB
english, 2010
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