[ACM Press the 32nd ACM/IEEE conference - San Francisco, California, United States (1995.06.12-1995.06.16)] Proceedings of the 32nd ACM/IEEE conference on Design automation conference - DAC '95 - Retargetable self-test program generation using constraint logic programming
Bieker, Ulrich, Marwedel, PeterYear:
1995
Language:
english
DOI:
10.1145/217474.217597
File:
PDF, 59 KB
english, 1995