[IEEE 2015 73rd Annual Device Research Conference (DRC) - Columbus, OH, USA (2015.6.21-2015.6.24)] 2015 73rd Annual Device Research Conference (DRC) - Spin-Hall effect MRAM based cache memory: A feasibility study
Kim, Jongyeon, Tuohy, Bill, Ma, Cong, Choi, Won Ho, Ahmed, Ibrahim, Lilja, David, Kim, Chris H.Year:
2015
Language:
english
DOI:
10.1109/DRC.2015.7175583
File:
PDF, 1.15 MB
english, 2015