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[IEEE 2015 20th International Mixed-Signal Testing Workshop (IMSTW) - Paris, France (2015.6.24-2015.6.26)] 2015 IEEE 20th International Mixed-Signals Testing Workshop (IMSTW) - A jitter injection signal generation and extraction system for embedded test of high-speed data I/O
Li, Yan, Bielby, Steven, Chowdhury, Azhar, Roberts, Gordon W.Year:
2015
Language:
english
DOI:
10.1109/IMS3TW.2015.7177879
File:
PDF, 1.30 MB
english, 2015