A Methodology to Emulate Single Event Upsets in Flip-Flops...

IEEE Transactions on Nuclear Science 2015 / 8 Vol. 62; Iss. 4

A Methodology to Emulate Single Event Upsets in Flip-Flops Using FPGAs through Partial Reconfiguration and Instrumentation

Serrano, Felipe, Clemente, Juan Antonio, Mecha, Hortensia
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2447391
Date:
August, 2015
File:
PDF, 1.01 MB
english, 2015
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