Circuit Simulation Based Validation of Flip-Flop Robustness...

IEEE Transactions on Nuclear Science 2015 / 8 Vol. 62; Iss. 4

Circuit Simulation Based Validation of Flip-Flop Robustness to Multiple Node Charge Collection

Shambhulingaiah, Sandeep, Lieb, Christopher, Clark, Lawrence T.
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2453795
Date:
August, 2015
File:
PDF, 2.02 MB
english, 2015
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