Runtime Self-Calibrated Temperature–Stress...

IEEE Transactions on Very Large Scale Integration (VLSI) Systems 2014 / 11 Vol. 22; Iss. 11

Runtime Self-Calibrated Temperature–Stress Cosensor for 3-D Integrated Circuits

Zhang, Chun, Ma, Dian, Li, Changzhi, Shi, Yiyu
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Volume:
22
Language:
english
Journal:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
DOI:
10.1109/TVLSI.2013.2290132
Date:
November, 2014
File:
PDF, 1.59 MB
english, 2014
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