[IEEE 32nd European Solid-State Device Research Conference...

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[IEEE 32nd European Solid-State Device Research Conference - Firenze, Italy (2002.9.24-2002.9.26)] 32nd European Solid-State Device Research Conference - Electrical Characteristics of Gd2O3 Thin Film Deposited on Si Substrate

Ohshima, C., Kashiwag, I., Ohmi, S.-I., Iwai, H.
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Year:
2002
Language:
english
DOI:
10.1109/essderc.2002.194956
File:
PDF, 426 KB
english, 2002
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