[IEEE 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014 - Raleigh, NC, USA (2014.8.4-2014.8.8)] 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) - VR noise analysis and reduction in printed circuit board designs
Ren, Yinglei, Shen, Wei, Xiao, KaiYear:
2014
Language:
english
DOI:
10.1109/isemc.2014.6899000
File:
PDF, 1.35 MB
english, 2014