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Supply Voltage Dependency on the Single Event Upset Susceptibility of Temporal Dual-Feedback Flip-Flops in a 90 nm Bulk CMOS Process
Hasanbegovic, Amir, Aunet, SnorreVolume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/tns.2015.2454479
Date:
August, 2015
File:
PDF, 1.71 MB
english, 2015