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The effects of the focus ion beam milling process on the optical properties of semiconductor nanostructures
Bellini, E, Taurino, A, Catalano, M, Lomascolo, M, Passaseo, A, Vasanelli, LVolume:
20
Language:
english
Journal:
Nanotechnology
DOI:
10.1088/0957-4484/20/25/255306
Date:
June, 2009
File:
PDF, 1.94 MB
english, 2009