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Various SEU conditions in SRAM studied by 3-D device simulation
Castellani-Coulie, K., Palau, J.-M., Hubert, G., Calvet, M.-C., Dodd, P.E., Sexton, F.Volume:
48
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/23.983153
Date:
January, 2001
File:
PDF, 211 KB
english, 2001