Study of Neutron Soft Error Rate (SER) Sensitivity:...

IEEE Transactions on Nuclear Science 2015 / 8 Vol. 62; Iss. 4

Study of Neutron Soft Error Rate (SER) Sensitivity: Investigation of Upset Mechanisms by Comparative Simulation of FinFET and Planar MOSFET SRAMs

Noh, Jinhyun, Correas, Vincent, Lee, Soonyoung, Jeon, Jongsung, Nofal, Issam, Cerba, Jacques, Belhaddad, Hafnaoui, Alexandrescu, Dan, Lee, YoungKeun, Kwon, Steve
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Volume:
62
Language:
english
Journal:
IEEE Transactions on Nuclear Science
DOI:
10.1109/TNS.2015.2450997
Date:
August, 2015
File:
PDF, 1.13 MB
english, 2015
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