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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Recent Developments in Optical Gauge Block Metrology - Uncertainty of gauge block calibration by mechanical comparison: a worked example for gauge blocks of dissimilar materials
Decker, Jennifer E., Ulrich, Anthony, Pekelsky, James R., Decker, Jennifer E., Brown, NicholasVolume:
3477
Year:
1998
Language:
english
DOI:
10.1117/12.323113
File:
PDF, 990 KB
english, 1998