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[ACM Press the 43rd annual conference - San Francisco, CA, USA (2006.07.24-2006.07.28)] Proceedings of the 43rd annual conference on Design automation - DAC '06 - Timing-based delay test for screening small delay defects
Ahmed, Nisar, Tehranipoor, Mohammad, Jayaram, VinayYear:
2006
Language:
english
DOI:
10.1145/1146909.1146993
File:
PDF, 644 KB
english, 2006