[ACM Press the 19th ACM SIGSOFT symposium and the 13th European conference - Szeged, Hungary (2011.09.05-2011.09.09)] Proceedings of the 19th ACM SIGSOFT symposium and the 13th European conference on Foundations of software engineering - SIGSOFT/FSE '11 - Micro interaction metrics for defect prediction
Lee, Taek, Nam, Jaechang, Han, DongGyun, Kim, Sunghun, In, Hoh PeterYear:
2011
Language:
english
DOI:
10.1145/2025113.2025156
File:
PDF, 599 KB
english, 2011