Validation of Direct Analysis Real Time...

Talanta 2015 / 11 Vol. 144

Validation of Direct Analysis Real Time source/Time-of-Flight Mass Spectrometry for organophosphate quantitation on wafer surface

Hayeck, Nathalie, Ravier, Sylvain, Gemayel, Rachel, Gligorovski, Sasho, Poulet, Irène, Maalouly, Jacqueline, Wortham, Henri
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Volume:
144
Language:
english
Journal:
Talanta
DOI:
10.1016/j.talanta.2015.07.080
Date:
November, 2015
File:
PDF, 2.12 MB
english, 2015
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