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Characterisation of WO3-, V2O5-, and P2O5-doped bismuth oxides by x-ray diffraction and Raman spectroscopy
G.A. Tompsett, N.M. Sammes, Y. Zhang, A. WatanabeVolume:
113-115
Year:
1998
Language:
english
Pages:
8
DOI:
10.1016/s0167-2738(98)00329-4
File:
PDF, 289 KB
english, 1998