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[IEEE IEEE Custom Integrated Circuits Conference - Boston, MA (May 3-6, 1992)] Proceedings of the IEEE Custom Integrated Circuits Conference - IEEE Standard 1149.1 Test Access Port And Boundary Scan Implementation In High Density CMOS Gate Arrays
Reddy, M., Dandas Tang,, Jones, R.Year:
1992
Language:
english
DOI:
10.1109/CICC.1992.591297
File:
PDF, 445 KB
english, 1992