[IEEE 2014 3rd International Conference on Reliability,...

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[IEEE 2014 3rd International Conference on Reliability, Infocom Technologies and Optimization (ICRITO) (Trends and Future Directions) - Noida, India (2014.10.8-2014.10.10)] Proceedings of 3rd International Conference on Reliability, Infocom Technologies and Optimization - Bandwidth extension of analog multiplier using dynamic threshold MOS transistor

Chaudhry, Amita, Niranjan, Vandana, Kumar, Ashwni
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Year:
2014
Language:
english
DOI:
10.1109/ICRITO.2014.7014682
File:
PDF, 201 KB
english, 2014
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