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SPIE Proceedings [SPIE Optical Engineering + Applications - San Diego, CA (Sunday 10 August 2008)] Remote Sensing System Engineering - Noise equivalent reflectance difference (NERD) vs. spatial resolution (SR) as a good measure for system performances
Citroen, Meira, Raz, Guy, Berger, Michael, Ardanuy, Philip E., Puschell, Jeffery J.Volume:
7087
Year:
2008
Language:
english
DOI:
10.1117/12.794632
File:
PDF, 251 KB
english, 2008