TEM MICROSTRUCTURE ANALYSIS FOR COMPRESSIVELY STRESSED...

Functional Materials Letters 2012 / 06 Vol. 5; Iss. 2

TEM MICROSTRUCTURE ANALYSIS FOR COMPRESSIVELY STRESSED Pb(Zr,Ti)O 3 THIN FILMS BY CSD-DERIVED LaNiO 3 BOTTOM ELECTRODES

OZAWA, KOTARO, ISHIZUKA, MASAAKI, SAKAMOTO, NAONORI, OHNO, TOMOYA, KIGUCHI, TAKANORI, MATSUDA, TAKESHI, KONNO, TOYOHIKO, WAKIYA, NAOKI, SUZUKI, HISAO
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Volume:
5
Language:
english
Journal:
Functional Materials Letters
DOI:
10.1142/S1793604712600168
Date:
June, 2012
File:
PDF, 274 KB
english, 2012
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