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[ACM Press the 20th IEEE/ACM international Conference - Long Beach, CA, USA (2005.11.07-2005.11.11)] Proceedings of the 20th IEEE/ACM international Conference on Automated software engineering - ASE '05 - Identifying traits with formal concept analysis
Lienhard, Adrian, Ducasse, Stéphane, Arévalo, GabrielaYear:
2005
Language:
english
DOI:
10.1145/1101908.1101921
File:
PDF, 232 KB
english, 2005