[ACM Press the 2008 workshop - Seattle, Washington (2008.07.20-2008.07.20)] Proceedings of the 2008 workshop on Defects in large software systems - DEFECTS '08 - Retrieving similar code fragments based on identifier similarity for defect detection
Yoshida, Norihiro, Ishio, Takashi, Matsushita, Makoto, Inoue, KatsuroYear:
2008
Language:
english
DOI:
10.1145/1390817.1390830
File:
PDF, 161 KB
english, 2008