[ACM Press the 33rd annual conference - Las Vegas, Nevada, United States (1996.06.03-1996.06.07)] Proceedings of the 33rd annual conference on Design automation conference - DAC '96 - Hierarchical electromigration reliability diagnosis for VLSI interconnects
Teng, Chin-Chi, Cheng, Yi-Kan, Rosenbaum, Elyse, Kang, Sung-MoYear:
1996
Language:
english
DOI:
10.1145/240518.240661
File:
PDF, 207 KB
english, 1996