Microstructure Study on Heterostructures of AlInGaN/GaN/Al...

Chinese Physics Letters 2006 / 09 Vol. 23; Iss. 9

Microstructure Study on Heterostructures of AlInGaN/GaN/Al 2 O 3 by Using Rutherford Backscattering/Channelling and XRD

Huan, Wang, Shu-De, Yao, Yao-Bo, Pan, Tong-Jun, Yu, Guo-Yi, Zhang
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Volume:
23
Language:
english
Journal:
Chinese Physics Letters
DOI:
10.1088/0256-307x/23/9/044
Date:
September, 2006
File:
PDF, 225 KB
english, 2006
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