[ACM Press the 37th conference - Los Angeles, California, United States (2000.06.05-2000.06.09)] Proceedings of the 37th conference on Design automation - DAC '00 - Dynamic noise analysis in precharge-evaluate circuits
Somasekhar, Dinesh, Choi, Seung Hoon, Roy, Kaushik, Ye, Yibin, De, VivekYear:
2000
Language:
english
DOI:
10.1145/337292.337406
File:
PDF, 168 KB
english, 2000