Identification of vacancy type defects in low and high...

Journal of Physics D Applied Physics 2005 / 12 Vol. 38; Iss. 24

Identification of vacancy type defects in low and high energy nitrogen ion implanted InP

Santhakumar, K, Rao, G Venugopal, Amarendra, G, Abhaya, S, Sastry, V Sankara, Nair, K G M, Ravichandran, V
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Volume:
38
Language:
english
Journal:
Journal of Physics D: Applied Physics
DOI:
10.1088/0022-3727/38/24/011
Date:
December, 2005
File:
PDF, 419 KB
english, 2005
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