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[IEEE International Electron Devices and Materials Symposium - Hsinchu, Taiwan (12-15 July, 1994)] International Electron Devices and Materials Symposium - Temperature dependence of porous silicon resistance
Insik Yu,, Il-Kyoo Park,, Chan-Scob Cho,, Jang-Kyoo Shin,, Jung-Hee Lee,, Jong-Hyun Lee,Year:
1994
Language:
english
DOI:
10.1109/EDMS.1994.771218
File:
PDF, 226 KB
english, 1994