[IEEE 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (EuroSimE) - Budapest, Hungary (2015.4.19-2015.4.22)] 2015 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems - A degradation model of aluminum electrolytic capacitors for LED drivers
Sun, Bo, Fan, Xuejun, Yuan, C.A., Cheng Qian,, Zhang, GuoqiYear:
2015
Language:
english
DOI:
10.1109/EuroSimE.2015.7103124
File:
PDF, 993 KB
english, 2015