[IEEE 2007 International Conference on Wavelet Analysis and Pattern Recognition - Beijing, China (2007.11.2-2007.11.4)] 2007 International Conference on Wavelet Analysis and Pattern Recognition - Multi-class SVM classifiers fusion based on evidence combination
De-Qiang Han,, Chong-Zhao Han,, Yi Yang,Year:
2007
Language:
english
DOI:
10.1109/ICWAPR.2007.4420736
File:
PDF, 389 KB
english, 2007