[IEEE IMTC/2002. 19th IEEE Instrumentation and Measurement Technology Conference - Anchorage, AK, USA (21-23 May 2002)] IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) - The VLSI implementation of an artificial neural network scheme embedded in an automated inspection quality management system

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