[ACM Press the 43rd annual conference - San Francisco, CA,...

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[ACM Press the 43rd annual conference - San Francisco, CA, USA (2006.07.24-2006.07.28)] Proceedings of the 43rd annual conference on Design automation - DAC '06 - Fault detection and diagnosis with parity trees for space compaction of test responses

Vranken, Harald, Goel, Sandeep Kumar, Glowatz, Andreas, Schloeffel, Juergen, Hapke, Friedrich
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Year:
2006
Language:
english
DOI:
10.1145/1146909.1147185
File:
PDF, 667 KB
english, 2006
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